发明授权
US09136264B2 MOS transistors having low offset values, electronic devices including the same, and methods of fabricating the same 有权
具有低偏移值的MOS晶体管,包括其的电子器件及其制造方法

  • 专利标题: MOS transistors having low offset values, electronic devices including the same, and methods of fabricating the same
  • 专利标题(中): 具有低偏移值的MOS晶体管,包括其的电子器件及其制造方法
  • 申请号: US14253493
    申请日: 2014-04-15
  • 公开(公告)号: US09136264B2
    公开(公告)日: 2015-09-15
  • 发明人: Hyun Min Song
  • 申请人: SK HYNIX INC.
  • 申请人地址: KR Icheon
  • 专利权人: SK HYNIX INC.
  • 当前专利权人: SK HYNIX INC.
  • 当前专利权人地址: KR Icheon
  • 优先权: KR10-2013-0157027 20131217
  • 主分类号: H01L27/088
  • IPC分类号: H01L27/088 H01L29/423 H01L29/06 H03F3/45 H01L21/8234 H01L29/786 H01L21/761
MOS transistors having low offset values, electronic devices including the same, and methods of fabricating the same
摘要:
A MOS transistor includes a gate electrode disposed over an active region without overlapping with an isolation region, the active region including a channel region, the isolation region defining the active region, a source region and a drain region disposed in first and second portions of the active region, respectively, the first and second portions being disposed at first and second sides of the gate electrode, respectively, the first side opposing the second side, a first blocking region disposed in a third portion of the active region between a third side of the gate electrode and the isolation region and between the source and the drain region, and a second blocking region disposed in a fourth portion of the active region between a fourth side of the gate electrode and the isolation region and between the source and the drain region, the fourth side opposing the third side.
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