发明授权
- 专利标题: Adjusting program and erase voltages in a memory device
- 专利标题(中): 调整程序和擦除存储器件中的电压
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申请号: US14150568申请日: 2014-01-08
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公开(公告)号: US09030874B2公开(公告)日: 2015-05-12
- 发明人: Seiichi Aritome
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Fletcher Yoder, P.C.
- 主分类号: G11C16/04
- IPC分类号: G11C16/04 ; G11C16/16 ; H01L27/02 ; H01L27/115
摘要:
A system and apparatus for adjusting threshold program and erase voltages in a memory array, such as a floating gate memory array, for example. One such method includes applying a first voltage level to a first edge word line of a memory block string and applying a second voltage level to a second edge word line of the memory block string. Such a method might also include applying a third voltage level to non-edge word lines of the memory block string.
公开/授权文献
- US20140119121A1 ADJUSTING PROGRAM AND ERASE VOLTAGES IN A MEMORY DEVICE 公开/授权日:2014-05-01
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