发明授权
US09005870B2 Actinic-ray- or radiation-sensitive resin composition and method of forming pattern using the composition
有权
光化学射线或辐射敏感性树脂组合物和使用该组合物形成图案的方法
- 专利标题: Actinic-ray- or radiation-sensitive resin composition and method of forming pattern using the composition
- 专利标题(中): 光化学射线或辐射敏感性树脂组合物和使用该组合物形成图案的方法
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申请号: US13015169申请日: 2011-01-27
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公开(公告)号: US09005870B2公开(公告)日: 2015-04-14
- 发明人: Hidenori Takahashi , Shuji Hirano , Hideaki Tsubaki
- 申请人: Hidenori Takahashi , Shuji Hirano , Hideaki Tsubaki
- 申请人地址: JP Tokyo
- 专利权人: FUJIFILM Corporation
- 当前专利权人: FUJIFILM Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Sughrue Mion, PLLC
- 优先权: JP2010-016035 20100127
- 主分类号: G03F7/004
- IPC分类号: G03F7/004 ; G03F7/039 ; G03F7/20
摘要:
According to one embodiment, an actinic-ray- or radiation-sensitive resin composition includes a resin (P) containing a repeating unit (A) that when exposed to actinic rays or radiation, is decomposed to thereby generate an acid and at least two types of repeating units B1), (B2) that when acted on by an acid, are decomposed to thereby generate an alkali-soluble group, wherein the alkali-soluble group generated by the repeating unit (B1) is different from the alkali-soluble group generated by the repeating unit (B2).
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