发明授权
US08963200B2 Methods and apparatus for increased holding voltage in silicon controlled rectifiers for ESD protection
有权
用于ESD保护的可控硅整流器中增加保持电压的方法和装置
- 专利标题: Methods and apparatus for increased holding voltage in silicon controlled rectifiers for ESD protection
- 专利标题(中): 用于ESD保护的可控硅整流器中增加保持电压的方法和装置
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申请号: US13527833申请日: 2012-06-20
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公开(公告)号: US08963200B2公开(公告)日: 2015-02-24
- 发明人: Jam-Wem Lee , Tzu-Heng Chang , Tsung-Che Tsai , Ming-Hsiang Song
- 申请人: Jam-Wem Lee , Tzu-Heng Chang , Tsung-Che Tsai , Ming-Hsiang Song
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater & Matsil, L.L.P.
- 主分类号: H01L29/45
- IPC分类号: H01L29/45
摘要:
Methods and apparatus for increased holding voltage SCRs. A semiconductor device includes a semiconductor substrate of a first conductivity type; a first well of the first conductivity type; a second well of a second conductivity type adjacent to the first well, an intersection of the first well and the second well forming a p-n junction; a first diffused region of the first conductivity type formed at the first well and coupled to a ground terminal; a first diffused region of the second conductivity type formed at the first well; a second diffused region of the first conductivity type formed at the second well and coupled to a pad terminal; a second diffused region of the second conductivity type formed in the second well; and a Schottky junction formed adjacent to the first diffused region of the second conductivity type coupled to a ground terminal. Methods for forming devices are disclosed.
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