发明授权
- 专利标题: Ion group irradiation device and secondary ion mass spectrometer
- 专利标题(中): 离子组照射装置和二次离子质谱仪
-
申请号: US14307696申请日: 2014-06-18
-
公开(公告)号: US08963078B2公开(公告)日: 2015-02-24
- 发明人: Yohei Murayama , Kota Iwasaki , Masafumi Kyogaku
- 申请人: Canon Kabushiki Kaisha
- 申请人地址: JP Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo
- 代理机构: Fitzpatrick, Cella, Harper & Scinto
- 优先权: JP2013-131637 20130624
- 主分类号: B01D59/44
- IPC分类号: B01D59/44 ; H01J49/00 ; H01J49/10
摘要:
The present invention provides an ion group irradiation device which includes: an ion source which generates an ion; and an ion group selecting unit which selects an ion group containing a cluster ion from ions released from the ion source, in an ion group irradiation device for irradiating a sample with the ion group, wherein the ion source has a pressure gradient forming unit for changing a pressure with which a material of the cluster ion is jetted, with time, the ion group selecting unit has a chopper which performs a chopping operation of selecting the ion group by passing and blocking the cluster ions in a traveling direction by the opening and closing of the chopper, and the chopper performs two or more times of the chopping operations per one time of a pressure gradient forming operation by the pressure gradient forming unit.
公开/授权文献
信息查询