发明授权
- 专利标题: Method of forming fine pattern, and developer
- 专利标题(中): 形成精细图案的方法和开发者
-
申请号: US13927464申请日: 2013-06-26
-
公开(公告)号: US08961802B2公开(公告)日: 2015-02-24
- 发明人: Shigenori Fujikawa , Harumi Hayakawa , Takahiro Senzaki , Ken Miyagi
- 申请人: Riken , Tokyo Ohka Kogyo Co., Ltd.
- 申请人地址: JP Kawasaki-shi JP Wako-shi
- 专利权人: Tokyo Ohka Kogyo Co., Ltd.,Riken
- 当前专利权人: Tokyo Ohka Kogyo Co., Ltd.,Riken
- 当前专利权人地址: JP Kawasaki-shi JP Wako-shi
- 代理机构: Knobbe Martens Olson & Bear LLP
- 优先权: JP2012-145474 20120628
- 主分类号: B81C1/00
- IPC分类号: B81C1/00 ; H01L21/033 ; H01L21/308 ; H01L21/311
摘要:
A method of forming a fine pattern, including: a phase separation step in which a layer containing a block copolymer having a plurality of blocks bonded is formed on a substrate, and then the layer is heated for phase separation of the layer; a decomposition step in which at least a portion of a phase of at least one block of the plurality of blocks constituting the block copolymer is decomposed; a selective removal step in which the layer is immersed in a developing solution to selectively remove a phase containing decomposed blocks to form a nano structure; and an etching step in which the substrate is subjected to etching by using the nano structure as a mask; and a main component of the developing solution is an organic solvent having an SP value of 7.5 to 11.5 (cal/cm3)1/2, and having vapor pressure of less than 2.1 kPa at 25° C., or is benzene that may be substituted by an alkyl group, an alkoxy group, or a halogen atom, and the developing solution further contains metal alkoxide.
公开/授权文献
- US20140054265A1 METHOD OF FORMING FINE PATTERN, AND DEVELOPER 公开/授权日:2014-02-27
信息查询