Invention Grant
- Patent Title: Semiconductor device and operating method thereof
- Patent Title (中): 半导体器件及其操作方法
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Application No.: US14012008Application Date: 2013-08-28
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Publication No.: US08953393B2Publication Date: 2015-02-10
- Inventor: Hong-Sik Kim , Hyung-Dong Lee , Hyung-Gyun Yang
- Applicant: SK Hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: William Park & Associates Patent Ltd.
- Priority: KR10-2012-0108909 20120928
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C29/00 ; G11C29/40 ; G11C29/04
Abstract:
A semiconductor device may test a semiconductor memory device by storing a data sample that is sampled from among data requested to be written into a semiconductor memory device and by comparing the data sample with data read from the semiconductor memory device which corresponds to the data sample.
Public/Granted literature
- US20140092693A1 SEMICONDUCTOR DEVICE AND OPERATING METHOD THEREOF Public/Granted day:2014-04-03
Information query
