发明授权
US08943333B2 Large scale integrated circuit for dynamically changing resonant point 有权
用于动态改变谐振点的大规模集成电路

  • 专利标题: Large scale integrated circuit for dynamically changing resonant point
  • 专利标题(中): 用于动态改变谐振点的大规模集成电路
  • 申请号: US12244242
    申请日: 2008-10-02
  • 公开(公告)号: US08943333B2
    公开(公告)日: 2015-01-27
  • 发明人: Kenichi Kawasaki
  • 申请人: Kenichi Kawasaki
  • 申请人地址: JP Kawasaki
  • 专利权人: Fujitsu Limited
  • 当前专利权人: Fujitsu Limited
  • 当前专利权人地址: JP Kawasaki
  • 代理机构: Arent Fox LLP
  • 优先权: JP2007-260871 20071004
  • 主分类号: G06F1/00
  • IPC分类号: G06F1/00 H03J3/20
Large scale integrated circuit for dynamically changing resonant point
摘要:
The semiconductor intergrated circuit comprises: a circuit that executes a predetermined process and a switching circuit that selects a power impedance, The switching circuit selects the power impedance, in accordance with a variation in voltage supplied to the circuit, so that a resonant frequency of the semiconductor integrated circuit is different from a operation frequency of the circuit.
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