Invention Grant
US08928365B2 Methods and devices for matching transmission line characteristics using stacked metal oxide semiconductor (MOS) transistors 有权
使用叠层金属氧化物半导体(MOS)晶体管匹配传输线特性的方法和装置

  • Patent Title: Methods and devices for matching transmission line characteristics using stacked metal oxide semiconductor (MOS) transistors
  • Patent Title (中): 使用叠层金属氧化物半导体(MOS)晶体管匹配传输线特性的方法和装置
  • Application No.: US13658778
    Application Date: 2012-10-23
  • Publication No.: US08928365B2
    Publication Date: 2015-01-06
  • Inventor: Miao LiJingcheng ZhuangYan HuXiaoliang BaiJing Kang
  • Applicant: QUALCOMM Incorporated
  • Applicant Address: US CA San Diego
  • Assignee: QUALCOMM Incorporated
  • Current Assignee: QUALCOMM Incorporated
  • Current Assignee Address: US CA San Diego
  • Agent Paul S. Holdaway
  • Main IPC: H03K3/00
  • IPC: H03K3/00
Methods and devices for matching transmission line characteristics using stacked metal oxide semiconductor (MOS) transistors
Abstract:
An output driver for electrostatic discharge (ESD) protection includes a first pair of stacked metal oxide semiconductor field-effect transistor (MOS) devices coupled between a power terminal and a first differential output terminal. The output driver also includes a second pair of stacked MOS devices coupled between a second differential output terminal and a ground terminal.
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