发明授权
- 专利标题: Film deposition apparatus and film deposition method
- 专利标题(中): 薄膜沉积装置和薄膜沉积方法
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申请号: US13430871申请日: 2012-03-27
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公开(公告)号: US08906246B2公开(公告)日: 2014-12-09
- 发明人: Hitoshi Kato , Takeshi Kumagai
- 申请人: Hitoshi Kato , Takeshi Kumagai
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: IPUSA, PLLC
- 优先权: JP2011-073193 20110329
- 主分类号: C23C16/56
- IPC分类号: C23C16/56 ; H01L21/02 ; C23C16/04 ; C23C16/40 ; C23C16/455
摘要:
A film deposition method includes steps of transferring a substrate having a pattern including a concave part into a vacuum chamber; supplying a first reaction gas to the substrate from a first reaction gas supplying part, thereby allowing the first reaction gas to be adsorbed on the substrate; supplying a second reaction gas that reacts with the first reaction gas to the substrate from a second reaction gas supplying part, thereby allowing the first reaction gas adsorbed on the substrate to react with the second reaction gas and forming a reaction product of the first and the second reaction gases on the substrate; supplying an alteration gas to the substrate through an activated gas supplying part capable of activating the alteration gas; and supplying an etching gas to the substrate chamber through the activated gas supplying part under an environment where the reaction product is not formed.
公开/授权文献
- US20120267341A1 FILM DEPOSITION APPARATUS AND FILM DEPOSITION METHOD 公开/授权日:2012-10-25
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