发明授权
- 专利标题: Ensuring sample adequacy using turbidity light scattering techniques
- 专利标题(中): 使用浊度光散射技术确保样品充足性
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申请号: US12588305申请日: 2009-10-09
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公开(公告)号: US08877507B2公开(公告)日: 2014-11-04
- 发明人: Jiulin Xia , Richard L. Mantefuel , Carl Theodore Edens , Jonathan Matthew Miller , Nadia P. Allen
- 申请人: Jiulin Xia , Richard L. Mantefuel , Carl Theodore Edens , Jonathan Matthew Miller , Nadia P. Allen
- 申请人地址: US MD Gaithersburg
- 专利权人: Qiagen Gaithersburg, Inc.
- 当前专利权人: Qiagen Gaithersburg, Inc.
- 当前专利权人地址: US MD Gaithersburg
- 代理机构: RatnerPrestia
- 主分类号: G01N21/51
- IPC分类号: G01N21/51 ; G01N35/00 ; B01L9/06 ; G01N21/03 ; G01N15/06
摘要:
An automated method for assuring sample adequacy. The method includes providing a sample in a testing container, activating an illumination source to pass an illumination beam through the testing container and into the sample, and detecting an intensity of an emitted beam. The emitted beam includes at least a portion of the illumination beam that has been scattered by the sample. The method also includes generating a sample turbidity measurement based on the intensity of the emitted beam, and determining, based on the sample turbidity measurement, an adequacy of the sample to provide accurate results in a primary test.
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