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US08848473B2 Semiconductor device and test method thereof 有权
半导体器件及其测试方法

Semiconductor device and test method thereof
摘要:
A semiconductor chip includes a memory array including a plurality of memory cells, a plurality of terminals including a plurality of test terminals to output a result of a specific test, and a circuit that outputs the result to a selected one of the plurality of test terminals based on a chip identification data.
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