发明授权
- 专利标题: Semiconductor device and test method thereof
- 专利标题(中): 半导体器件及其测试方法
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申请号: US14088242申请日: 2013-11-22
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公开(公告)号: US08848473B2公开(公告)日: 2014-09-30
- 发明人: Naohisa Nishioka
- 申请人: Elpida Memory, Inc.
- 申请人地址: LU Luxembourg
- 专利权人: PS4 Luxco S.A.R.L.
- 当前专利权人: PS4 Luxco S.A.R.L.
- 当前专利权人地址: LU Luxembourg
- 代理机构: McGinn IP Law Group, PLLC
- 优先权: JP2010-230332 20101013
- 主分类号: G11C29/00
- IPC分类号: G11C29/00 ; G11C29/26 ; G11C16/20 ; G11C29/08 ; G11C29/44 ; G11C7/10 ; G11C11/4093
摘要:
A semiconductor chip includes a memory array including a plurality of memory cells, a plurality of terminals including a plurality of test terminals to output a result of a specific test, and a circuit that outputs the result to a selected one of the plurality of test terminals based on a chip identification data.
公开/授权文献
- US20140078843A1 SEMICONDUCTOR DEVICE AND TEST METHOD THEREOF 公开/授权日:2014-03-20
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