发明授权
US08815654B2 Vertical current controlled silicon on insulator (SOI) device such as a silicon controlled rectifier and method of forming vertical SOI current controlled devices
有权
垂直电流控制绝缘体上硅(SOI)器件,例如可控硅整流器,以及形成垂直SOI电流控制器件的方法
- 专利标题: Vertical current controlled silicon on insulator (SOI) device such as a silicon controlled rectifier and method of forming vertical SOI current controlled devices
- 专利标题(中): 垂直电流控制绝缘体上硅(SOI)器件,例如可控硅整流器,以及形成垂直SOI电流控制器件的方法
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申请号: US11762811申请日: 2007-06-14
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公开(公告)号: US08815654B2公开(公告)日: 2014-08-26
- 发明人: Robert J. Gauthier, Jr. , Junjun Li , Souvick Mitra , Mahmoud A Mousa , Christopher S. Putnam
- 申请人: Robert J. Gauthier, Jr. , Junjun Li , Souvick Mitra , Mahmoud A Mousa , Christopher S. Putnam
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Law Office of Charles W. Peterson, Jr.
- 代理商 Anthony Canale
- 主分类号: H01L21/84
- IPC分类号: H01L21/84 ; H01L27/02
摘要:
A Silicon on Insulator (SOI) Integrated Circuit (IC) chip with devices such as a vertical Silicon Controlled Rectifier (SCR), vertical bipolar transistors, a vertical capacitor, a resistor and/or a vertical pinch resistor and method of making the device(s). The devices are formed in a seed hole through the SOI surface layer and insulator layer to the substrate. A buried diffusion, e.g., N-type, is formed through the seed hole in the substrate. A doped epitaxial layer is formed on the buried diffusion and may include multiple doped layers, e.g., a P-type layer and an N-type layer. Polysilicon, e.g., P-type, may be formed on the doped epitaxial layer. Contacts to the buried diffusion are formed in a contact liner.
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