发明授权
US08756995B2 Device and method for combining samples from an inertial measurement sensor cluster
有权
用于组合惯性测量传感器集群的样本的装置和方法
- 专利标题: Device and method for combining samples from an inertial measurement sensor cluster
- 专利标题(中): 用于组合惯性测量传感器集群的样本的装置和方法
-
申请号: US13924743申请日: 2013-06-24
-
公开(公告)号: US08756995B2公开(公告)日: 2014-06-24
- 发明人: Dekel Tzidon , Alex Braginsky
- 申请人: Elbit Systems Ltd.
- 申请人地址: IL Haifa
- 专利权人: Elbit Systems Ltd.
- 当前专利权人: Elbit Systems Ltd.
- 当前专利权人地址: IL Haifa
- 代理机构: Brown Rudnick LLP
- 优先权: IL195104 20081104
- 主分类号: G01P15/18
- IPC分类号: G01P15/18 ; G01C21/00 ; G01P3/04
摘要:
Device and method for providing inertial indications with high accuracy using micro inertial sensors with inherent very small size and low accuracy. The device and method of the invention disclose use of the cluster of multiple micro inertial sensors to receive from the multiple sensors an equivalent single inertial indication with high accuracy based on the multiple independent indications and mathematical manipulations for averaging the plurality of single readings and for eliminating common deviations based, for example, on measurements of the deviation of the single readings.
公开/授权文献
信息查询