发明授权
- 专利标题： Test apparatus and test method
- 专利标题（中）： 试验装置及试验方法
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申请号： US12962569申请日： 2010-12-07
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公开(公告)号： US08743702B2公开(公告)日： 2014-06-03
- 发明人: Shinichi Ishikawa , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- 申请人： Shinichi Ishikawa , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- 申请人地址： JP Tokyo
- 专利权人： Advantest Corporation
- 当前专利权人： Advantest Corporation
- 当前专利权人地址： JP Tokyo
- 主分类号： H04L1/00
- IPC分类号： H04L1/00 ; H04L12/26 ; G01R31/08
摘要：
Provided is a test apparatus that tests a device under test, comprising: a plurality of channels that output and receive signals to and from the device under test; a generating section that generates a packet data sequence transmitted to and from the device under test; and a channel selecting section that selects which of the channels is used to transmit the packet data sequence generated by the generating section.
公开/授权文献
- US20110137606A1 TEST APPARATUS AND TEST METHOD 公开/授权日：2011-06-09
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