发明授权
- 专利标题: Memory devices having break cells
- 专利标题(中): 具有断裂电池的存储器件
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申请号: US13765704申请日: 2013-02-13
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公开(公告)号: US08743581B2公开(公告)日: 2014-06-03
- 发明人: Yukit Tang , Kuoyuan Hsu , Derek Tao
- 申请人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Duane Morris LLP
- 主分类号: G11C15/02
- IPC分类号: G11C15/02 ; G11C11/00
摘要:
A representative memory device includes a cell array, at least one break cell that subdivides the cell array into bit cell arrays, and one or more power switches that are electrically coupled to the bit cell. In one embodiment, the break cell separates a connectivity of a first voltage and a second voltage between at least two bit cell arrays so that the bit cell arrays can be selectively coupled to either the first voltage or the second voltage using the power switches. The power switches control the connection of each separated bit cell array of the cell array to either the first voltage or second voltage.
公开/授权文献
- US20130155751A1 MEMORY DEVICES HAVING BREAK CELLS 公开/授权日:2013-06-20
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