Invention Grant
- Patent Title: Methods for protecting patterned features during trench etch
- Patent Title (中): 在沟槽蚀刻期间保护图案特征的方法
-
Application No.: US13890321Application Date: 2013-05-09
-
Publication No.: US08722518B2Publication Date: 2014-05-13
- Inventor: Steven J. Radigan , Usha Raghuram , Samuel V. Dunton , Michael W. Konevecki
- Applicant: SanDisk 3D LLC
- Applicant Address: US CA Milpitas
- Assignee: SanDisk 3D LLC
- Current Assignee: SanDisk 3D LLC
- Current Assignee Address: US CA Milpitas
- Agency: Dugan & Dugan, PC
- Main IPC: H01L21/326
- IPC: H01L21/326 ; H01L21/82 ; H01L21/44 ; H01L23/525 ; H01L27/102 ; H01L29/66

Abstract:
A method is provided for forming a monolithic three dimensional memory array. The method includes forming a first memory level above a substrate, and monolithically forming a second memory level above the first memory level. The first memory level is formed by forming first substantially parallel conductors extending in a first direction, forming first pillars above the first conductors, each first pillar including a first conductive layer or layerstack above a vertically oriented diode, the first pillars formed in a single photolithography step, depositing a first dielectric layer above the first pillars, etching first trenches in the first dielectric layer, the first trenches extending in a second direction. After etching, a lowest point in the trenches is above a lowest point of the first conductive layer or layerstack, and the first conductive layer or layerstack does not include a resistivity-switching metal oxide or nitride. Numerous other aspects are provided.
Public/Granted literature
- US20130244395A1 METHODS FOR PROTECTING PATTERNED FEATURES DURING TRENCH ETCH Public/Granted day:2013-09-19
Information query
IPC分类: