Invention Grant
- Patent Title: Crystallization method of amorphous silicon layer
- Patent Title (中): 非晶硅层的结晶方法
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Application No.: US13746158Application Date: 2013-01-21
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Publication No.: US08697585B2Publication Date: 2014-04-15
- Inventor: In-Do Chung
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Knobbe, Martens Olson & Bear, LLP
- Priority: KR10-2010-0022446 20100312
- Main IPC: H01L21/268
- IPC: H01L21/268

Abstract:
A crystallization method is disclosed. In one embodiment, the method includes providing a substrate having an amorphous silicon layer, wherein the substate has first and second sides opposing each other and irradiating a laser beam onto the substrate so as to have an inclined angle with respect to the first and second sides of the substrate. The method further includes relatively moving one of the laser beam and the substate with respect to the other i) in a first direction from the first side to the second side of the substate and ii) in a second direction which crosses the first direction.
Public/Granted literature
- US20130130514A1 CRYSTALLIZATION METHOD OF AMORPHOUS SILICON LAYER Public/Granted day:2013-05-23
Information query
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