发明授权
- 专利标题: Measuring macrocell quality using femtocell
- 专利标题(中): 使用毫微微小区测量宏小区质量
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申请号: US13447414申请日: 2012-04-16
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公开(公告)号: US08655347B2公开(公告)日: 2014-02-18
- 发明人: Ki-Ho Lee , Yong-Gyoo Lee , Yung-Ha Ji
- 申请人: Ki-Ho Lee , Yong-Gyoo Lee , Yung-Ha Ji
- 申请人地址: KR Gyeonggi-do
- 专利权人: KT Corporation
- 当前专利权人: KT Corporation
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: IP Legal Services, LLC
- 优先权: KR10-2011-0034853 20110414
- 主分类号: H04W4/00
- IPC分类号: H04W4/00
摘要:
The disclosure is related to measuring macrocell quality of a macrocell using femtocells. A method may be provided for measuring macrocell quality of at least one macrocell using a femtocell base station. The method may include measuring, by the femtocell base station, macrocell quality of at least one macrocell based on event information, generating macrocell quality report information based on a result of the measuring, and transmitting the generated macrocell quality report information to a server through a femtocell gateway. The measuring macrocell quality may include determining whether a macrocell identifier is present in the event information, measuring the macrocell quality of a target macrocell corresponding to the mermen identifier of the event when the macrocell identifier is present in the event information, and measuring the macrocell quality of substantially all neighbor macrocells when the macrocell identifier is absent from the event information.
公开/授权文献
- US20120264419A1 MEASURING MACROCELL QUALITY USING FEMTOCELL 公开/授权日:2012-10-18
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