Invention Grant
- Patent Title: Evaluating high frequency time domain in embedded device probing
- Patent Title (中): 评估嵌入式设备探测中的高频时域
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Application No.: US13567462Application Date: 2012-08-06
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Publication No.: US08645091B2Publication Date: 2014-02-04
- Inventor: Joseph Curtis Diepenbrock , Roland Frech
- Applicant: Joseph Curtis Diepenbrock , Roland Frech
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Schmeiser, Olsen & Watts, LLP
- Agent Randall J. Bluestone
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A method and associated system for evaluating a high-frequency signal (SNE) at a point of interest on a signal path. The high-frequency signal (SNE) at the point of interest on the signal path is calculated by applying an inverse transfer function (iG) for the signal path to an argument of a remote signal (SFE) measured at a remote pickup point on the signal path, wherein the point of interest and the remote pickup point are two distant points on the signal path, wherein the high-frequency signal (SNE) and the remote signal (SFE) are represented as a respective time domain variable, and wherein said calculating is performed by a time domain evaluation process that operates in test equipment for electrical devices. The calculated high-frequency signal (SNE) is transferred to an output device of the test equipment.
Public/Granted literature
- US20120296590A1 EVALUATING HIGH FREQUENCY TIME DOMAIN IN EMBEDDED DEVICE PROBING Public/Granted day:2012-11-22
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