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US08645091B2 Evaluating high frequency time domain in embedded device probing 失效
评估嵌入式设备探测中的高频时域

Evaluating high frequency time domain in embedded device probing
Abstract:
A method and associated system for evaluating a high-frequency signal (SNE) at a point of interest on a signal path. The high-frequency signal (SNE) at the point of interest on the signal path is calculated by applying an inverse transfer function (iG) for the signal path to an argument of a remote signal (SFE) measured at a remote pickup point on the signal path, wherein the point of interest and the remote pickup point are two distant points on the signal path, wherein the high-frequency signal (SNE) and the remote signal (SFE) are represented as a respective time domain variable, and wherein said calculating is performed by a time domain evaluation process that operates in test equipment for electrical devices. The calculated high-frequency signal (SNE) is transferred to an output device of the test equipment.
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