发明授权
- 专利标题： Method and device for determining impedance of depression
- 专利标题（中）： 用于确定抑郁症阻抗的方法和装置
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申请号： US13237164申请日： 2011-09-20
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公开(公告)号： US08633717B2公开(公告)日： 2014-01-21
- 发明人: Shang-Tai Yeh , Jia-Ming Chen , Shun-Lung Ho
- 申请人： Shang-Tai Yeh , Jia-Ming Chen , Shun-Lung Ho
- 申请人地址： TW Taipei
- 专利权人： Egalax—Empia Technology Inc.
- 当前专利权人： Egalax—Empia Technology Inc.
- 当前专利权人地址： TW Taipei
- 代理机构： WAPT, PC
- 代理商 Justin King
- 优先权： TW98112745A 20090417
- 主分类号： G01R27/08
- IPC分类号： G01R27/08 ; G01L1/20
摘要：
A method and the device for position detection are disclosed. The device comprises a plurality of strips intersecting each other to form a plurality of intersecting regions. A pair of depressed strips intersecting on an intersecting region contact to each other on a contact point to form a depressed intersecting region, wherein the contact impedance of the contact point is determined according to the position of the contact point and the voltages on the contact point of one and the other of the pair depressed strips.
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