发明授权
- 专利标题: Analysis system for analyzing a sample on a test element
- 专利标题(中): 用于分析测试元素上的样本的分析系统
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申请号: US13662234申请日: 2012-10-26
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公开(公告)号: US08597589B2公开(公告)日: 2013-12-03
- 发明人: Paul Jansen , Jochen Schulat , Yvonne Hillenbrand
- 申请人: Roche Diagnostics Operations, Inc.
- 申请人地址: US IN Indianapolis
- 专利权人: Roche Diagnostics Operations, Inc.
- 当前专利权人: Roche Diagnostics Operations, Inc.
- 当前专利权人地址: US IN Indianapolis
- 代理机构: Bose McKinney & Evans LLP
- 优先权: DE102004036474 20040728
- 主分类号: G01N21/75
- IPC分类号: G01N21/75 ; G01N31/22 ; G01N33/52 ; G01N30/96 ; G01N21/00
摘要:
The invention relates to an analysis system for analyzing a sample on a test element. The system has an analysis unit for generating a signal as a function of an analyte contained in a sample, and a detection unit for detecting the signal. The analysis system further includes a test element holder into which the test element can be reversibly introduced and in which it can be positioned relative to the analysis unit and the detection unit. The test element contains at least one guide element, which is suitable for laterally guiding the test element, so that the test element in the test element holder is held and guided only on an outer region of the test element, and an inner region of the test element introduced into the test element holder remains free. The test element contains a sample application site in the inner region.
公开/授权文献
- US20130052082A1 ANALYSIS SYSTEM FOR ANALYZING A SAMPLE ON A TEST ELEMENT 公开/授权日:2013-02-28
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