发明授权
US08499230B2 Critical path monitor for an integrated circuit and method of operation thereof 失效
集成电路的关键路径监视器及其操作方法

  • 专利标题: Critical path monitor for an integrated circuit and method of operation thereof
  • 专利标题(中): 集成电路的关键路径监视器及其操作方法
  • 申请号: US12247992
    申请日: 2008-10-08
  • 公开(公告)号: US08499230B2
    公开(公告)日: 2013-07-30
  • 发明人: Sreejit Chakravarty
  • 申请人: Sreejit Chakravarty
  • 申请人地址: US CA Milpitas
  • 专利权人: LSI Corporation
  • 当前专利权人: LSI Corporation
  • 当前专利权人地址: US CA Milpitas
  • 主分类号: G06F11/00
  • IPC分类号: G06F11/00
Critical path monitor for an integrated circuit and method of operation thereof
摘要:
A path monitor, a method of monitoring a path, an integrated circuit and a library of standard logic elements. In one embodiment, the path monitor includes: (1) a delay element having an input couplable to an input of a clocked flip-flop associated with a path to be monitored and configured to provide a predetermined delay and (2) a clocked exclusive OR gate having a clock input, a first input coupled to an output of the delay element, a second input couplable to the output of the clocked flip-flop and an output at which the clocked exclusive OR gate is configured to respond to a clock signal to provide an error signal only when logic levels of the first input and the second input differ.
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