发明授权
- 专利标题: Exposure method and exposure apparatus
- 专利标题(中): 曝光方法和曝光装置
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申请号: US13251850申请日: 2011-10-03
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公开(公告)号: US08497979B2公开(公告)日: 2013-07-30
- 发明人: Koichi Kajiyama
- 申请人: Koichi Kajiyama
- 申请人地址: JP Yokohama-shi
- 专利权人: V Technology Co., Ltd.
- 当前专利权人: V Technology Co., Ltd.
- 当前专利权人地址: JP Yokohama-shi
- 代理机构: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- 优先权: JP2009-090617 20090403
- 主分类号: G03B27/42
- IPC分类号: G03B27/42 ; G03B27/72 ; G03F7/20
摘要:
In the present invention, when exposure on a first exposure area of the subject to be exposed by using a first mask pattern group of a photomask, is completed, the shutter is moved in synchronization with a conveying speed of the subject to be exposed to shut off source light, the subject to be exposed is returned by a distance in which the subject to be exposed moves while the shutter moves, and the mask pattern group is switched to a second mask pattern group by moving the photomask. When the switching of the mask pattern group of the photomask is completed, the conveying of the subject to be exposed is restarted. At the same time, the shutter is moved in synchronization with the conveying speed of the subject to be exposed to release the shut off of the source light, and exposure on a second exposure area is performed.
公开/授权文献
- US20120113403A1 EXPOSURE METHOD AND EXPOSURE APPARATUS 公开/授权日:2012-05-10
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