发明授权
- 专利标题: Gate structures
- 专利标题(中): 门结构
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申请号: US13599507申请日: 2012-08-30
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公开(公告)号: US08441107B2公开(公告)日: 2013-05-14
- 发明人: Peng-Soon Lim , Chia-Pin Lin , Kuang-Yuan Hsu
- 申请人: Peng-Soon Lim , Chia-Pin Lin , Kuang-Yuan Hsu
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Haynes and Boone, LLP
- 主分类号: H01L29/06
- IPC分类号: H01L29/06
摘要:
An apparatus includes a first device. The first device includes a first projection and a first gate structure, the first projection extending upwardly from a substrate and having a first channel region therein, and the first gate structure engaging the first projection adjacent the first channel region. The first structure includes an opening over the first channel region, and a conformal, pure metal with a low resistivity disposed in the opening. The apparatus also includes a second device that includes a second projection and a second gate structure, the second projection extending upwardly from the substrate and having a second channel region therein, and the second gate structure engaging the second projection adjacent the second channel region. The second structure includes a silicide disposed over the second channel region, wherein the silicide includes a metal that is the same metal disposed in the opening.
公开/授权文献
- US20120319192A1 Gate Structures 公开/授权日:2012-12-20
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