Invention Grant
US08411282B2 On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference 有权
基于差分干涉对比和/或表面等离子体辅助干涉的片上相位显微镜/光束轮廓仪

On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference
Abstract:
A differential interference contrast (DIC) determination device and method utilizes an illumination source, a layer having a pair of two apertures that receive illumination from the illumination source, and a photodetector to receive Young's interference from the illumination passing through the pair of two apertures. In addition, a surface wave assisted optofluidic microscope and method utilize an illumination source, a fluid channel having a layer with at least one aperture as a surface, and a photodetector that receives a signal based on the illumination passing through the aperture. The layer is corrugated (e.g., via fabrication) and parameters of the corrugation optimize the signal received on the photodetector.
Information query
Patent Agency Ranking
0/0