Invention Grant
US08411282B2 On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference
有权
基于差分干涉对比和/或表面等离子体辅助干涉的片上相位显微镜/光束轮廓仪
- Patent Title: On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference
- Patent Title (中): 基于差分干涉对比和/或表面等离子体辅助干涉的片上相位显微镜/光束轮廓仪
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Application No.: US13157245Application Date: 2011-06-09
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Publication No.: US08411282B2Publication Date: 2013-04-02
- Inventor: Xiquan Cui , Changhuei Yang , Axel Scherer , Demetri Psaltis , Xin Heng
- Applicant: Xiquan Cui , Changhuei Yang , Axel Scherer , Demetri Psaltis , Xin Heng
- Applicant Address: US CA Pasadena
- Assignee: California Institute of Technology
- Current Assignee: California Institute of Technology
- Current Assignee Address: US CA Pasadena
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Agent Sheila Martinez-Lemke
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
A differential interference contrast (DIC) determination device and method utilizes an illumination source, a layer having a pair of two apertures that receive illumination from the illumination source, and a photodetector to receive Young's interference from the illumination passing through the pair of two apertures. In addition, a surface wave assisted optofluidic microscope and method utilize an illumination source, a fluid channel having a layer with at least one aperture as a surface, and a photodetector that receives a signal based on the illumination passing through the aperture. The layer is corrugated (e.g., via fabrication) and parameters of the corrugation optimize the signal received on the photodetector.
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