Invention Grant
- Patent Title: Method of correcting a position of a prober
- Patent Title (中): 纠正探测器位置的方法
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Application No.: US12656520Application Date: 2010-02-02
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Publication No.: US08400174B2Publication Date: 2013-03-19
- Inventor: Seung-Yong Oh , Byoung Joo Kim , Dae-Gab Chi , Ki-Yoon Kim
- Applicant: Seung-Yong Oh , Byoung Joo Kim , Dae-Gab Chi , Ki-Yoon Kim
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2009-0008227 20090203
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
A method of correcting a position of a prober, the method including obtaining a first image of a pad, the pad having a predetermined reference contact position, contacting the prober to the pad after obtaining the first image of the pad, obtaining a second image of the pad after contacting the prober to the pad, determining an actual contact position of an actual contact mark on the pad, the actual contact mark being produced by the contacting of the prober to the pad, comparing the second image to the first image to obtain an offset data, the offset data relating the actual contact position to the reference contact position, and correcting the position of the prober by aligning the actual contact position with the reference contact position based on the offset data.
Public/Granted literature
- US20100194418A1 Method of correcting a position of a prober Public/Granted day:2010-08-05
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