Invention Grant
- Patent Title: Analyzer, ionization apparatus and analyzing method
- Patent Title (中): 分析仪，电离装置及分析方法
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Application No.: US13084930Application Date: 2011-04-12
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Publication No.: US08368013B2Publication Date: 2013-02-05
- Inventor: Masako Ishimaru , Yuichiro Hashimoto , Hideki Hasegawa , Masuyoshi Yamada , Masuyuki Sugiyama , Hidetoshi Morokuma
- Applicant: Masako Ishimaru , Yuichiro Hashimoto , Hideki Hasegawa , Masuyoshi Yamada , Masuyuki Sugiyama , Hidetoshi Morokuma
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2010-095619 20100419
- Main IPC: B01D59/44
- IPC: B01D59/44 ; H01J49/00
Abstract:
An analyzer performs dielectric barrier discharge and ionization of a sample by a reaction between the sample and excited molecules or ions generated by the dielectric barrier discharge at a pressure lower than an atmospheric pressure.
Public/Granted literature
- US20110253889A1 ANALYZER, IONIZATION APPARATUS AND ANALYZING METHOD Public/Granted day:2011-10-20
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