发明授权
- 专利标题: System and method for precision phase shift measurement
- 专利标题(中): 用于精密相移测量的系统和方法
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申请号: US12434419申请日: 2009-05-01
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公开(公告)号: US08364430B2公开(公告)日: 2013-01-29
- 发明人: Paul L. Kebabian
- 申请人: Paul L. Kebabian
- 申请人地址: US MA Billerica
- 专利权人: Aerodyne Research, Inc.
- 当前专利权人: Aerodyne Research, Inc.
- 当前专利权人地址: US MA Billerica
- 代理机构: Cesari and McKenna, LLP
- 主分类号: G01R25/00
- IPC分类号: G01R25/00
摘要:
In one embodiment, a frequency generator produces an excitation signal, a local oscillator signal, and a reference signal at a difference frequency of the excitation signal and local oscillator signal. The excitation signal is applied to a physical system to produce a response signal, which is mixed with the local oscillator signal. A filter selects a difference frequency component. The frequencies of the excitation signal and/or local oscillator signal are varied, such that the magnitude of the difference frequency is constant, but a sign of the difference frequency changes from positive to negative. The phase shift of the difference frequency component, with respect to the reference signal, at each of the two signs of the difference frequency, is measured. The measured phase shift at the negative sign is subtracted from the measured phase shift at the positive sign, and the difference is divided in half, to produce a result.
公开/授权文献
- US20100057390A1 SYSTEM AND METHOD FOR PRECISION PHASE SHIFT MEASUREMENT 公开/授权日:2010-03-04
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