发明授权
US08340939B2 Method and apparatus for selecting paths for use in at-speed testing 有权
用于选择在速度测试中使用的路径的方法和装置

Method and apparatus for selecting paths for use in at-speed testing
摘要:
In one embodiment, the invention is a method and apparatus for selecting paths for use in at-speed testing. One embodiment of a method for selecting a set of n paths with which to test an integrated circuit chip includes: organizing the set of n paths into a plurality of sub-sets, receiving a new candidate path, and adding the new candidate path to one of the sub-sets when the new candidate path improves the process coverage metric of the sub-sets.
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