Invention Grant
- Patent Title: Method of etching sacrificial layer
- Patent Title (中): 蚀刻牺牲层的方法
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Application No.: US12830370Application Date: 2010-07-05
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Publication No.: US08298950B2Publication Date: 2012-10-30
- Inventor: Chan-Lon Yang , Yeng-Peng Wang , Chiu-Hsien Yeh
- Applicant: Chan-Lon Yang , Yeng-Peng Wang , Chiu-Hsien Yeh
- Applicant Address: TW Hsinchu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsinchu
- Agent Ding Yu Tan
- Main IPC: H01L21/311
- IPC: H01L21/311

Abstract:
An exemplary method of etching sacrificial layer includes steps of: providing a substrate formed with a sacrificial layer and defined with a first region and a second region, the sacrificial layer disposed in both the first and second regions; forming a hard mask covering the first region while exposing the second region; performing a first etching process on the sacrificial layer to thin the sacrificial layer while forming a byproduct film overlying the thinned sacrificial layer; performing a second etching process on the byproduct film to remove a portion of the byproduct layer for exposing a portion of the thinned sacrificial layer, while another portion of the byproduct film disposed on sidewalls of the thinned sacrificial layer being remained; and performing a third etching process on the thinned sacrificial layer, to remove the portion of the thinned sacrificial layer exposed in the second etching process.
Public/Granted literature
- US20120003835A1 METHOD OF ETCHING SACRIFICIAL LAYER Public/Granted day:2012-01-05
Information query
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