Invention Grant
- Patent Title: Resistive memory and methods of processing resistive memory
- Patent Title (中): 电阻记忆和处理电阻记忆的方法
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Application No.: US12776764Application Date: 2010-05-10
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Publication No.: US08283198B2Publication Date: 2012-10-09
- Inventor: David H. Wells
- Applicant: David H. Wells
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L29/08

Abstract:
Resistive memory and methods of processing resistive memory are described herein. One or more method embodiments of processing resistive memory include forming a resistive memory cell material on an electrode having an access device contact, and forming a heater electrode on the resistive memory cell material after forming the resistive memory cell material on the electrode such that the heater electrode is self-aligned to the resistive memory cell material.
Public/Granted literature
- US20110272660A1 RESISTIVE MEMORY AND METHODS OF PROCESSING RESISTIVE MEMORY Public/Granted day:2011-11-10
Information query
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