Invention Grant
- Patent Title: Methods of view selection for radioactive emission measurements
- Patent Title (中): 放射性发射测量方法的选择方法
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Application No.: US11628074Application Date: 2005-06-01
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Publication No.: US08280124B2Publication Date: 2012-10-02
- Inventor: Eli Dichterman , Ran Ravhon , Michael Nagler
- Applicant: Eli Dichterman , Ran Ravhon , Michael Nagler
- Applicant Address: US NY Orangeburg
- Assignee: Spectrum Dynamics LLC
- Current Assignee: Spectrum Dynamics LLC
- Current Assignee Address: US NY Orangeburg
- International Application: PCT/IL2005/000572 WO 20050601
- International Announcement: WO2005/118659 WO 20051215
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method is described for identifying an optimal, or preferred set of views for radioactive-emission measurements of a body structure, based on modeling the body structure, in terms of its geometry and radioactive emission distribution, obtaining different sets of views of the model, and scoring the different sets of views, with a scoring function, using information theoretic measures, for example, for uniformity, reliability and separability in reconstruction.The preferred set of views may then be applied in imaging the in-vivo body structure, that has been modeled.
Public/Granted literature
- US20080260228A1 Methods of View Selection for Radioactive Emission Measurements Public/Granted day:2008-10-23
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