发明授权
- 专利标题: Test apparatus and diagnosis method
- 专利标题(中): 测试仪器及诊断方法
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申请号: US12633660申请日: 2009-12-08
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公开(公告)号: US08275569B2公开(公告)日: 2012-09-25
- 发明人: Satoshi Horiguchi
- 申请人: Satoshi Horiguchi
- 申请人地址: JP Tokyo
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Chen Yoshimura LLP
- 优先权: JP2008-317456 20081212
- 主分类号: G01R27/00
- IPC分类号: G01R27/00 ; G01R31/00 ; G01R15/00 ; G01R31/28 ; G01R31/02 ; G01R1/00
摘要:
Provided is a test apparatus that tests a device under test, comprising: a plurality of modules that each include an output circuit that outputs a prescribed output signal to the device under test and a measurement circuit that measures a prescribed characteristic of the device under test; and a control section that, for each module, causes the measurement circuit to measure output of the output circuit and diagnoses the module based on a measurement result of the measurement circuit. Each measurement circuit measures the output of the corresponding output circuit in parallel, and the control section is provided in common to the plurality of modules and sequentially reads the measurement result of the measurement circuit of each module.
公开/授权文献
- US20100153054A1 TEST APPARATUS AND DIAGNOSIS METHOD 公开/授权日:2010-06-17
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