发明授权
- 专利标题: Cleanup method for optics in immersion lithography supplying cleaning liquid at different times than immersion liquid
- 专利标题(中): 浸没光刻中的光学清理方法,在浸没液体的不同时间提供清洗液
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申请号: US12379171申请日: 2009-02-13
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公开(公告)号: US08269946B2公开(公告)日: 2012-09-18
- 发明人: Hidemi Kawai
- 申请人: Hidemi Kawai
- 申请人地址: JP Tokyo
- 专利权人: Nikon Corporation
- 当前专利权人: Nikon Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Oliff & Berridge, PLC
- 主分类号: G03B27/52
- IPC分类号: G03B27/52
摘要:
A lithographic apparatus includes a substrate table on which a substrate is held, a projection system including a final optical element, the projection system projecting a patterned beam of radiation through an immersion liquid onto the substrate adjacent the final optical element to expose the substrate during an immersion lithography process, and a liquid supply system including an inlet. The liquid supply system supplies the immersion liquid during the immersion lithography process and supplies a cleaning liquid, which is different from the immersion liquid, during a cleanup process. The cleanup process and the immersion lithography process are performed at different times.
公开/授权文献
- US20090161084A1 Cleanup method for optics in immersion lithography 公开/授权日:2009-06-25
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