发明授权
US08269946B2 Cleanup method for optics in immersion lithography supplying cleaning liquid at different times than immersion liquid 有权
浸没光刻中的光学清理方法,在浸没液体的不同时间提供清洗液

  • 专利标题: Cleanup method for optics in immersion lithography supplying cleaning liquid at different times than immersion liquid
  • 专利标题(中): 浸没光刻中的光学清理方法,在浸没液体的不同时间提供清洗液
  • 申请号: US12379171
    申请日: 2009-02-13
  • 公开(公告)号: US08269946B2
    公开(公告)日: 2012-09-18
  • 发明人: Hidemi Kawai
  • 申请人: Hidemi Kawai
  • 申请人地址: JP Tokyo
  • 专利权人: Nikon Corporation
  • 当前专利权人: Nikon Corporation
  • 当前专利权人地址: JP Tokyo
  • 代理机构: Oliff & Berridge, PLC
  • 主分类号: G03B27/52
  • IPC分类号: G03B27/52
Cleanup method for optics in immersion lithography supplying cleaning liquid at different times than immersion liquid
摘要:
A lithographic apparatus includes a substrate table on which a substrate is held, a projection system including a final optical element, the projection system projecting a patterned beam of radiation through an immersion liquid onto the substrate adjacent the final optical element to expose the substrate during an immersion lithography process, and a liquid supply system including an inlet. The liquid supply system supplies the immersion liquid during the immersion lithography process and supplies a cleaning liquid, which is different from the immersion liquid, during a cleanup process. The cleanup process and the immersion lithography process are performed at different times.
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