发明授权
US08269508B2 Method and system for optimal source impedance matching at the input of electronic components, particularly transistors 有权
在电子元件输入端,特别是晶体管的最佳源阻抗匹配方法和系统

  • 专利标题: Method and system for optimal source impedance matching at the input of electronic components, particularly transistors
  • 专利标题(中): 在电子元件输入端,特别是晶体管的最佳源阻抗匹配方法和系统
  • 申请号: US12818301
    申请日: 2010-06-18
  • 公开(公告)号: US08269508B2
    公开(公告)日: 2012-09-18
  • 发明人: Tony Gasseling
  • 申请人: Tony Gasseling
  • 申请人地址: FR Limoges
  • 专利权人: AMCAD Engineering
  • 当前专利权人: AMCAD Engineering
  • 当前专利权人地址: FR Limoges
  • 代理机构: Bachman & LaPointe, P.C.
  • 优先权: FR0902961 20090618
  • 主分类号: G01R35/00
  • IPC分类号: G01R35/00
Method and system for optimal source impedance matching at the input of electronic components, particularly transistors
摘要:
A method for determining optimal source impedance at the input of a device under testing (DUT) in a measurement bench, includes the steps of calibrating a source pull type bench as a measurement bench, adjusting a load impedance and continuous bias of the DUT, generating an electric power signal by the source and injected in the DUT, acquiring input impedances of the DUT and corresponding gain performances.
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