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1.发明授权Method and system for optimal source impedance matching at the input of electronic components, particularly transistors 有权在电子元件输入端，特别是晶体管的最佳源阻抗匹配方法和系统公开(公告)号：US08269508B2
公开(公告)日：2012-09-18
申请号：US12818301
申请日：2010-06-18
申请人： Tony Gasseling
发明人： Tony Gasseling
IPC分类号： G01R35/00
CPC分类号： G01R31/2822
摘要： A method for determining optimal source impedance at the input of a device under testing (DUT) in a measurement bench, includes the steps of calibrating a source pull type bench as a measurement bench, adjusting a load impedance and continuous bias of the DUT, generating an electric power signal by the source and injected in the DUT, acquiring input impedances of the DUT and corresponding gain performances.
摘要翻译： 一种用于在测量台中测试（DUT）输入端确定最佳源阻抗的方法包括以下步骤：将源拉式工作台校准为测量台，调整DUT的负载阻抗和连续偏置，产生 由源极引入的电力信号并注入到DUT中，获取DUT的输入阻抗和相应的增益性能。
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2.发明申请公开(公告)号：US20100321033A1
公开(公告)日：2010-12-23
申请号：US12818301
申请日：2010-06-18
申请人： Tony Gasseling
发明人： Tony Gasseling
IPC分类号： G01R35/00
CPC分类号： G01R31/2822
摘要： A method for determining optimal source impedance at the input of a device under testing (DUT) in a measurement bench, includes the steps of calibrating a source pull type bench as a measurement bench, adjusting a load impedance and continuous bias of the DUT, generating an electric power signal by the source and injected in the DUT, acquiring input impedances of the DUT and corresponding gain performances.
摘要翻译： 一种用于在测量台中测试（DUT）输入端确定最佳源阻抗的方法包括以下步骤：将源拉式工作台校准为测量台，调整DUT的负载阻抗和连续偏置，产生 由源极引入的电力信号并注入到DUT中，获取DUT的输入阻抗和相应的增益性能。
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