Invention Grant
US08238151B2 Transient heat assisted STTRAM cell for lower programming current
有权
瞬态热辅助STTRAM电池用于较低的编程电流
- Patent Title: Transient heat assisted STTRAM cell for lower programming current
- Patent Title (中): 瞬态热辅助STTRAM电池用于较低的编程电流
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Application No.: US12642533Application Date: 2009-12-18
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Publication No.: US08238151B2Publication Date: 2012-08-07
- Inventor: Jun Liu , Gurtej Sandhu
- Applicant: Jun Liu , Gurtej Sandhu
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder
- Main IPC: G11C11/14
- IPC: G11C11/14

Abstract:
A memory cell including magnetic materials and heating materials, and methods of programming the memory cell are provided. The memory cell includes a free region, a pinned region, and a heating region configured to generate and transfer heat to the free region when a programming current is directed to the cell. The heat transferred from the heating region increases the temperature of the free region, which decreases the magnetization and the critical switching current density of the free region. In some embodiments, the heating region may also provide a current path to the free region, and the magnetization of the free region may be switched according to the spin polarity of the programming current, programming the memory cell to a high resistance state or a low resistance state.
Public/Granted literature
- US20110149646A1 TRANSIENT HEAT ASSISTED STTRAM CELL FOR LOWER PROGRAMMING CURRENT Public/Granted day:2011-06-23
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