发明授权
- 专利标题: Run length encoding in VLIW architecture
- 专利标题(中): 在VLIW架构中运行长度编码
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申请号: US11842224申请日: 2007-08-21
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公开(公告)号: US08233545B2公开(公告)日: 2012-07-31
- 发明人: Kapil Ahuja , Pavan V. Shastry , Ratna M. V. Reddy
- 申请人: Kapil Ahuja , Pavan V. Shastry , Ratna M. V. Reddy
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 Robert D. Marshall, Jr.; Wade James Brady, III; Frederick J. Telecky, Jr.
- 主分类号: H04N7/12
- IPC分类号: H04N7/12
摘要:
A computer implemented method of video data encoding generates a mask having one bit corresponding each spatial frequency coefficient of a block during quantization. The bit state of the mask depends upon whether the corresponding quantized spatial frequency coefficient is zero or non-zero. The runs of zero quantized spatial frequency coefficients determined by a left most bit detect instruction are determined from the mask and run length encoded. The mask is generated using a look up table to map the scan order of quantization to the zig-zag order of run length encoding. Variable length coding and inverse quantization optionally take place within the run length encoding loop.
公开/授权文献
- US20080046698A1 Run Length Encoding in VLIW Architecture 公开/授权日:2008-02-21
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