Invention Grant
- Patent Title: Scanning electron microscope
- Patent Title (中): 扫描电子显微镜
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Application No.: US12770244Application Date: 2010-04-29
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Publication No.: US08188428B2Publication Date: 2012-05-29
- Inventor: Kohei Yamaguchi , Kenji Obara
- Applicant: Kohei Yamaguchi , Kenji Obara
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2006-311599 20061117; JP2006-319201 20061127
- Main IPC: H01J37/28
- IPC: H01J37/28

Abstract:
A technique executes autofocus adjustment stably even when a plurality of patterns or foreign matter capable of being imaged only by a specific detector are included independently. Such an image as a concavo-convex image having a weak contrast can be picked up. The technique can automatically focus such an image even when it is difficult to find a focus position in the image. A scanning electron microscope includes a plurality of detectors for detecting secondary signals from a specimen when irradiated with an electron beam, and a calculation unit for combining the signals obtained from the detectors. At least two of the detectors are provided to be symmetric with respect to the electron beam. The focus of the electron beam is adjusted based on the signals of the detectors or on a signal corresponding to a combination of the signals.
Public/Granted literature
- US20100213371A1 SCANNING ELECTRON MICROSCOPE Public/Granted day:2010-08-26
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