发明授权
- 专利标题: Systems and methods for stepped data retry in a storage system
- 专利标题(中): 存储系统中步进数据重试的系统和方法
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申请号: US12556145申请日: 2009-09-09
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公开(公告)号: US08176404B2公开(公告)日: 2012-05-08
- 发明人: Shaohua Yang , Weijun Tan , Yuan Xing Lee
- 申请人: Shaohua Yang , Weijun Tan , Yuan Xing Lee
- 申请人地址: US CA Milpitas
- 专利权人: LSI Corporation
- 当前专利权人: LSI Corporation
- 当前专利权人地址: US CA Milpitas
- 代理机构: Hamilton, DeSanctis & Cha
- 主分类号: G11C29/00
- IPC分类号: G11C29/00
摘要:
Various embodiments of the present invention provide systems and methods for data processing retries. As an example, a data processing retry circuit is discussed that includes a stepped erasure window register, and an erasure flag set circuit. The stepped erasure window register includes: an erasure flag location, an erasure flag length, and a step size. The erasure flag set circuit is operable to assert a first erasure flag beginning at the erasure flag location and having the erasure flag length at a first time. In addition, the erasure flag set circuit is operable to assert a second erasure flag beginning at the erasure flag location plus the step size, and having the erasure flag length at a second time.
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