Invention Grant
- Patent Title: Mass spectrometric analyzer
- Patent Title (中): 质谱仪
-
Application No.: US12078680Application Date: 2008-04-03
-
Publication No.: US08129674B2Publication Date: 2012-03-06
- Inventor: Izumi Ogata , Yasushi Terui
- Applicant: Izumi Ogata , Yasushi Terui
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2007-098546 20070404
- Main IPC: B01D59/44
- IPC: B01D59/44 ; H01J49/00 ; H01J49/40

Abstract:
A tandem mass spectrometer comprising an ion source for ionizing a sample, an ion trap section for carrying out collision induced dissociation of the target ions thereby to produce fragment ions, a multi electrode collision section for conducting collision induced dissociation of fragment ions discharged from the ion trap section, a mass spectrometer section for conducting mass spectrometric analysis of the converged fragment ions. After the target ions selected by the ion trap section are subjected to collision induced dissociation, specific fragment ions among the fragment ions are selected and transferred to the multi electrode collision section thereby to carry out collision induced dissociation therein.
Public/Granted literature
- US20080315082A1 Mass spectrometric analyzer Public/Granted day:2008-12-25
Information query