Invention Grant
- Patent Title: Improving design manufacturing, and transportation in mass manufacturing through analysis of defect data
- Patent Title (中): 通过分析缺陷数据,改进设计制造和批量生产的运输
-
Application No.: US11876035Application Date: 2007-10-22
-
Publication No.: US08126581B2Publication Date: 2012-02-28
- Inventor: Timothy J. Kostyk , Theresa C. Kratschmer , Jeff R. Layton , Peter Kenneth Malkin , Stephen G. Perun , Kenneth L. Pyra , Padmanabhan Santhanam , John C. Thomas , Scott W. Weller
- Applicant: Timothy J. Kostyk , Theresa C. Kratschmer , Jeff R. Layton , Peter Kenneth Malkin , Stephen G. Perun , Kenneth L. Pyra , Padmanabhan Santhanam , John C. Thomas , Scott W. Weller
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Michael J. Buchenhorner; Vazken Alexanian
- Main IPC: G06F17/00
- IPC: G06F17/00 ; G06F7/00

Abstract:
A system for optimizing at least one of a design, production, or testing process of a product in a mass manufacturing process includes: a central processing unit; a network interface operatively connected to the central processing unit; a storage device; a memory including logic for execution by the central processing unit, wherein the logic includes: a server handler made up of a client applet and a client interface servlet which are configured for enabling authorized end-user communication; an error data collection handler configured for gathering error data; an error data classification handler; an analysis handler; a suggested actions report handler; and the system further includes a server database configured for storing, modifying, and deleting data.
Public/Granted literature
Information query