发明授权
- 专利标题: Cobalt-doped indium-tin oxide films and methods
- 专利标题(中): 钴掺杂铟锡氧化物膜和方法
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申请号: US11823658申请日: 2007-06-28
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公开(公告)号: US08119514B2公开(公告)日: 2012-02-21
- 发明人: Kie Y. Ahn , Leonard Forbes
- 申请人: Kie Y. Ahn , Leonard Forbes
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Schwegman, Lundberg & Woessner, P.A.
- 主分类号: H01L21/44
- IPC分类号: H01L21/44
摘要:
Methods of forming cobalt-doped indium-tin oxide structures are shown. Properties of structures include transparency, conductivity, and ferromagnetism. Monolayers that contain indium, monolayers that contain tin, and monolayers that contain cobalt are deposited onto a substrate and subsequently processed to form cobalt-doped indium-tin oxide. Devices that include oxide structures formed with these methods should have better step coverage over substrate topography and more robust film mechanical properties.
公开/授权文献
- US20090004759A1 Cobalt-doped indium-tin oxide films and methods 公开/授权日:2009-01-01
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