发明授权
- 专利标题: Spin-torque probe microscope
- 专利标题(中): 旋转力矩探头显微镜
-
申请号: US12059407申请日: 2008-03-31
-
公开(公告)号: US08069492B2公开(公告)日: 2011-11-29
- 发明人: Haiwen Xi , Song S. Xue
- 申请人: Haiwen Xi , Song S. Xue
- 申请人地址: US CA Scotts Valley
- 专利权人: Seagate Technology LLC
- 当前专利权人: Seagate Technology LLC
- 当前专利权人地址: US CA Scotts Valley
- 代理机构: Mueting, Raasch & Gebhardt PA
- 主分类号: G01Q60/08
- IPC分类号: G01Q60/08
摘要:
A spin-torque probe microscope and methods of using the same are described. The spin-torque probe microscope includes a cantilever probe body, a magnetic tip disposed at a distal end of the cantilever probe body, an electrically conductive sample disposed proximate to the magnetic tip, an electrical circuit providing a spin-polarized electron current to the electrically conductive sample, and a vibration detection element configured to sense vibration frequency of the cantilever probe body. The spin-polarized electron current is sufficient to alter a local electron spin or magnetic moment within the electrically conductive sample and be sensed by the magnetic tip.
公开/授权文献
- US20090242764A1 SPIN-TORQUE PROBE MICROSCOPE 公开/授权日:2009-10-01
信息查询