发明授权
- 专利标题: A/D conversion circuit and test method
- 专利标题(中): A / D转换电路和测试方法
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申请号: US12662711申请日: 2010-04-29
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公开(公告)号: US08018362B2公开(公告)日: 2011-09-13
- 发明人: Tomoya Katsuki , Shinichirou Saitou
- 申请人: Tomoya Katsuki , Shinichirou Saitou
- 申请人地址: JP Kawasaki-shi, Kanagawa
- 专利权人: Renesas Electronics Corporation
- 当前专利权人: Renesas Electronics Corporation
- 当前专利权人地址: JP Kawasaki-shi, Kanagawa
- 代理机构: McGinn IP Law Group, PLLC
- 优先权: JP2009-114279 20090511
- 主分类号: H03M1/00
- IPC分类号: H03M1/00
摘要:
An A/D conversion circuit includes a plurality of transmission paths that transmit signal voltages and reference voltages, and an A/D conversion unit that A/D converts voltages output from the transmission paths. Each of the plurality of transmission paths includes a first switch that selectively outputs one of the signal voltage and the reference voltage, an S/H circuit that holds output voltage from the first switch, and a second switch that selectively outputs one of the output voltage from the first switch and output voltage from the S/H circuit.
公开/授权文献
- US20100283644A1 A/D conversion circute and test method 公开/授权日:2010-11-11
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