发明授权
- 专利标题: Resistance change memory device
- 专利标题(中): 电阻变化记忆装置
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申请号: US12389606申请日: 2009-02-20
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公开(公告)号: US08004873B2公开(公告)日: 2011-08-23
- 发明人: Haruki Toda
- 申请人: Haruki Toda
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2008-042348 20080225
- 主分类号: G11C11/00
- IPC分类号: G11C11/00
摘要:
A resistance change memory device including a memory cell array with first wirings, second wirings, and memory cells, the memory cell including a diode and a variable resistance element, anode of diodes being located on the first wiring side, wherein the memory cell array is sequentially set in the following three states after power-on: a waiting state defined by that both the first and second wirings are set at a first voltage; a standby state defined by that the first wirings are kept at the first voltage and the second wirings are set at a second voltage higher than the first voltage; and an access state defined by that a selected first wiring and a selected second wiring are set at a third voltage higher than the first voltage and the first voltage, respectively.
公开/授权文献
- US20090213639A1 RESISTANCE CHANGE MEMORY DEVICE 公开/授权日:2009-08-27
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