发明授权
- 专利标题: Delay locked loop circuit of semiconductor device
- 专利标题(中): 半导体器件的延迟锁定环路
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申请号: US12262517申请日: 2008-10-31
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公开(公告)号: US07990785B2公开(公告)日: 2011-08-02
- 发明人: Hee-Woong Song , Kun-Woo Park , Yong-Ju Kim , Ic-Su Oh , Hyung-Soo Kim , Tae-Jin Hwang , Hae-Rang Choi , Ji-Wang Lee
- 申请人: Hee-Woong Song , Kun-Woo Park , Yong-Ju Kim , Ic-Su Oh , Hyung-Soo Kim , Tae-Jin Hwang , Hae-Rang Choi , Ji-Wang Lee
- 申请人地址: KR Gyeonggi-do
- 专利权人: Hynix Semiconductor Inc.
- 当前专利权人: Hynix Semiconductor Inc.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: IP & T Group LLP
- 优先权: KR10-2007-0111758 20071102
- 主分类号: G11C7/00
- IPC分类号: G11C7/00
摘要:
A semiconductor memory device includes a delay locked loop circuit that can control input/output timing of data according to a system clock of a high frequency. The semiconductor memory device includes a phase comparator configured to detect a phase difference between an internal clock and a reference clock to output a state signal having a pulse width corresponding to the detected phase difference, a phase adjuster configured to generate a digital code for determining a delay time corresponding to the state signal for locking a phase of the internal clock, a digital-to-analog converter configured to convert the digital code to an analog voltage, and a multiphase delay signal generator configured to delay the internal clock according to a bias voltage corresponding to the analog voltage to feed back the delayed internal clock as the internal clock and generate multiphase delay signals.
公开/授权文献
- US20090116306A1 DELAY LOCKED LOOP CIRCUIT OF SEMICONDUCTOR DEVICE 公开/授权日:2009-05-07
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