发明授权
- 专利标题: Local oxidation of silicon planarization for polysilicon layers under thin film structures
- 专利标题(中): 在薄膜结构下多晶硅层的硅平面化的局部氧化
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申请号: US11776116申请日: 2007-07-11
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公开(公告)号: US07981759B2公开(公告)日: 2011-07-19
- 发明人: Andrew Cervin-Lawry , Mircea Capanu
- 申请人: Andrew Cervin-Lawry , Mircea Capanu
- 申请人地址: US NH Nashua
- 专利权人: Paratek Microwave, Inc.
- 当前专利权人: Paratek Microwave, Inc.
- 当前专利权人地址: US NH Nashua
- 代理机构: Guntin Meles & Gust, PLC
- 代理商 Andrew Gust
- 主分类号: H01L21/20
- IPC分类号: H01L21/20
摘要:
In accordance with the teachings described herein, a method for fabricating a patterned polysilicon layer having a planar surface may include the steps of: depositing a polysilicon film above a substrate material; depositing an oxide-resistant mask over the polysilicon film; patterning and etching the oxide-resistant mask to form a patterned mask layer over the polysilicon film, such that the polysilicon film includes masked and unmasked portions; etching the unmasked portions of the polysilicon film for a first amount of time; oxidizing the etched polysilicon film for a second amount of time to form an oxide layer that defines the patterned polysilicon layer; and removing the patterned mask layer; wherein the first and second amounts of time are selected such that the oxide layer and the patterned polysilicon layer have about the same thickness and form a planar surface.
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